3 results
Study of SEM images obtained with an electron energy and take-off angle (E-θ) selective detector
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1693-1694
- Print publication:
- August 2015
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SEM Image Observation Using an Electron Energy and Electron Take-off Angle Filtered Detector
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 36-37
- Print publication:
- August 2014
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Field Emission SEM with a Spherical and Chromatic Aberration Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1370-1371
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- August 2004
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