4 results
Multilayer Laue Lenses (MLL) with 45 mm Focal Length as Optics for In-situ Nanoindentation Experiments
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 436-437
- Print publication:
- August 2018
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Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures
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- Journal:
- Powder Diffraction / Volume 31 / Issue 4 / December 2016
- Published online by Cambridge University Press:
- 28 September 2016, pp. 267-273
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A Novel Technique to Determine Elastic Constants of Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1139 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1139-GG03-31
- Print publication:
- 2008
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A Direct Method of Determining Complex Depth Profiles of Residual Stresses in Thin Films on a Nanoscale - Mechanics of Residually Stressed Systems
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1052 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1052-DD03-06
- Print publication:
- 2007
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