3 results
Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 978-979
- Print publication:
- August 2018
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Chemical Shift of Electron Energy-Loss Near-Edge Structure on the Nitrogen K-Edge and Titanium L3-Edge at TiN/Ti Interface
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 2 / April 2009
- Published online by Cambridge University Press:
- 16 March 2009, pp. 106-113
- Print publication:
- April 2009
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A FIB Micro-Sampling Technique for Three-Dimensional Characterization of a Site-Specific Defect
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- Journal:
- Microscopy Today / Volume 12 / Issue 6 / November 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 26-29
- Print publication:
- November 2004
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