6 results
A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications
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- Journal:
- Microscopy Today / Volume 12 / Issue 6 / November 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 36-37
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- November 2004
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A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1048-1049
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- August 2004
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A Silicon Multi-Cathode Detector For Microanalysis Applications
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- Journal:
- Microscopy Today / Volume 11 / Issue 5 / August 2003
- Published online by Cambridge University Press:
- 14 March 2018, pp. 24-25
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- August 2003
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Resolving Common Element Problem by Using Different Lines in Fundamental Parameters Method Multilayer Thin Film Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 213-218
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- 1993
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A Simple Approach to Multilayer Thin Film Analysis Based on Theoretical Calculations Using Fundamental Parameters Method
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- Journal:
- Advances in X-ray Analysis / Volume 36 / 1992
- Published online by Cambridge University Press:
- 06 March 2019, pp. 279-286
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- 1992
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New Developments in FP-Based Software for Both Bulk and Thin-Film XRF Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 703-709
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- 1991
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