11 results
Practical Implementation of Compressive Sensing for High Resolution STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 558-559
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1046-1047
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 618-619
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
High-Precision Chemical Analysis and Structural Determination of Functional Oxides by STEM-EELS
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1918-1919
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 976-977
- Print publication:
- July 2012
-
- Article
- Export citation
Atomic resolution transmission imaging at 30keV via electron ptychography
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1024-1025
- Print publication:
- July 2012
-
- Article
- Export citation
Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1258-1259
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Aberration-Corrected STEM Investigation of Metallic Ti Cluster Formation in Mg-Ti Hydrides
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1678-1679
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1248-1249
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Novel Multivariate Statistical Analysis Methods for STEM/EELS
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1306-1307
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Applications of Atomic-Resolution EELS Mapping at Low kV
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 786-787
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation