11 results
Contributors
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- Book:
- Robert Frost in Context
- Published online:
- 05 April 2014
- Print publication:
- 14 April 2014, pp ix-xvi
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Analytical Electron microscopy Investigation of Au/TiO2 Thin Films Deposited on the Glass Substrate
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1498-1499
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- August 2013
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Study for Automated Imaging with Phase Plate Electron Microscopy and Suggestions for the Future Instrumentation
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 500-501
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- July 2012
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Analyses of Semiconductor Materials by Spectrometric Full-color Cathodoluminescence Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 806-807
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- July 2010
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Influence of Debye-Waller Factor and Structure Data in Quantitative HAADF-STEM of Interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 376-377
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- September 2007
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High-Resolution HAADF STEM of Inversion Boundaries in Sb2O3-Doped Zinc Oxide
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 494-495
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- August 2002
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Deconvolution Process of High-Resolution HAADF STEM Images
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 492-493
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- August 2002
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Atomic Scale Grain Boundary Analysis by Incoherent Imaging With TEM/STEM
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 124-125
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- August 2000
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Compositional Characterization of an O-N-O Layer in a Dram Using FE-(S)TEM And EELS
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 150-151
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- July 1998
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Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and Energy Filtered Elemental Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 148-149
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- July 1998
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Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and EDS Elemental Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 146-147
- Print publication:
- July 1998
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