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Site Specific TEM Analysis of Micrometer-Sized Particles with the FIB Lift-Out Technique
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 518-519
- Print publication:
- August 2000
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- Article
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