2 results
Electrical Characterization of Silicon - Nickel Iron Oxide Heterojunctions
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- Journal:
- MRS Advances / Volume 4 / Issue 41-42 / 2019
- Published online by Cambridge University Press:
- 19 July 2019, pp. 2241-2248
- Print publication:
- 2019
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- Article
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FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films
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- Journal:
- MRS Advances / Volume 1 / Issue 49 / 2016
- Published online by Cambridge University Press:
- 13 June 2016, pp. 3361-3366
- Print publication:
- 2016
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- Article
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