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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
- Print publication:
- August 2014
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- Article
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Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
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- Journal:
- MRS Online Proceedings Library Archive / Volume 892 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, 0892-FF26-11
- Print publication:
- 2005
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- Article
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