3 results
3D Microstructure Characterization of a Silicon Based Anode Material on Different Length Scales suitable for Storage Applications
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 356-357
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
3D Characterization of Silicon Based Electrode Material for Advanced Lithium-Ion Storage Technologies
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2026-2027
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1284-1285
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation