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3D Characterization of Silicon Based Electrode Material for Advanced Lithium-Ion Storage Technologies
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2026-2027
- Print publication:
- July 2017
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Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1284-1285
- Print publication:
- July 2011
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