12 results
Evaluating Compositional Variation in InGaAs Random Alloys Using Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 398-399
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- August 2018
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A realist approach to the evaluation of complex mental health interventions
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- Journal:
- The British Journal of Psychiatry / Volume 213 / Issue 2 / August 2018
- Published online by Cambridge University Press:
- 20 July 2018, pp. 451-453
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- August 2018
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Laser Flash Analysis Determination of the Thermal Diffusivity of Si/SiGe Superlattices
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- MRS Online Proceedings Library Archive / Volume 1490 / 2013
- Published online by Cambridge University Press:
- 18 February 2013, pp. 45-50
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- 2013
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Salmonellosis in wild mammals
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- Journal of Hygiene / Volume 77 / Issue 1 / August 1976
- Published online by Cambridge University Press:
- 15 May 2009, pp. 51-54
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Gene expression profiling of tolerant barley in response to Diuraphis noxia (Hemiptera: Aphididae) feeding
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- Bulletin of Entomological Research / Volume 99 / Issue 2 / April 2009
- Published online by Cambridge University Press:
- 08 October 2008, pp. 163-173
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Mechanisms of Stacking Fault Growth in SiC PiN Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 815 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, J6.4
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- 2004
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The microstructure of GaN nucleation layers grown by MOCVD on (1120) sapphire versus pressure and temperature
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- Journal:
- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y5.32
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- 2003
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Effect of growth temperature on the microstructure of the nucleation layers of GaN grown by MOCVD on (1120) sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 743 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, L3.19
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- 2002
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Microstructure of GaN Grown on (1120) Sapphire
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- MRS Online Proceedings Library Archive / Volume 639 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, G3.9
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- 2000
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Ge-Related Interfacial Defects in Sige Alloy Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 453
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- 1995
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Ge-Related Interfacial Defects In SiGe Alloy Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 573
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- 1995
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Fabrication of Bond and Etch Back Silicon on Insulator Using SiGe-MBE and Selective Etching Techniques
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- Journal:
- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 291
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- 1991
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