12 results
Exploring the Validity Limits of Direct Ptychographic Methods to Analyse 4D Scanning Transmission Electron Microscopy Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 420-421
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- August 2022
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Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1836-1837
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- July 2010
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Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1888-1889
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- July 2010
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Dopant Impurity Induced Nanofaceting on Silicon Nanowire Sidewalls
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1740-1741
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- July 2010
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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1834-1835
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- July 2010
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Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 76-77
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- July 2010
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Simulating Atomic Resolution STEM Images of Non-Periodic Samples
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 928-929
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- August 2008
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Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 104-105
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- August 2008
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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 92-93
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- August 2008
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STM and HRTEM of Nanostructures and Metal Nanocrystals on SrTiO3 (001)
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 528-529
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- August 2007
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Prospects for 3D Characterization of Materials by Aberration Corrected STEM and SCEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 130-131
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- August 2007
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Three-dimensional Characterisation of Nanomaterials Using Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1338-1339
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- August 2006
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