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HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr2FeMoO6 (SFMO) and Sr2CrReO6 (SCRO)
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1654-1655
- Print publication:
- July 2011
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- Article
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