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AFM, XPS and XRD Studies of W Films Growth by Lpcvd Onto Tin Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 382 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 395
- Print publication:
- 1995
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- Article
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Compositional Characterization of Very Thin SiO2/Si3N4/SiO2 Stacked Films by XPS Using The “Auger Parameter Method”
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- Journal:
- MRS Online Proceedings Library Archive / Volume 382 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 437
- Print publication:
- 1995
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- Article
- Export citation