10 results
Correlative Analysis in the Semiconductor Industry
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2502-2503
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Cryogenic UHV Specimen Preparation for APT: A Transfer Solution
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 528-529
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Multivariate Statistical Analysis of Atom Probe Tomography Data
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 270-271
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Looking Inside the Fascinating Nanoworld Controlling Light Emission from InGaN/GaN Quantum Well Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1890-1891
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Analysis of Bulk Dielectrics with Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1254-1255
- Print publication:
- August 2008
-
- Article
- Export citation
Advantages of Using a Digital Detector for Field Ion Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 124-125
- Print publication:
- August 2008
-
- Article
- Export citation
Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 454-455
- Print publication:
- August 2008
-
- Article
- Export citation
Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1230-1231
- Print publication:
- August 2008
-
- Article
- Export citation
Arsenic Segregation to Dislocation Loops in Silicon
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 324-325
- Print publication:
- August 2008
-
- Article
- Export citation
Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1738-1739
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation