2 results
HRTEM Study on the Interface of Si-based Resonant Tunneling Diodes (RTD) by UHV Wafer Bonding Technology
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 804-805
- Print publication:
- August 2007
-
- Article
- Export citation
Electrical Characterization of a Single TiO2 Nanotube by Using Modified FIB/SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1272-1273
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation