30 results
Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD)
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 768-771
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- August 2020
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FEGSEM X-Ray Mapping System with Multiple SDDs for Quantitative X-Ray Mapping and Imaging
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 64-66
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- August 2020
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X-ray Mapping Characterisation of Hybrid Alkaline Cement Discolouration Area
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1266-1269
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- August 2020
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Cobalt Doping in Tantalum Nitride Thin Films Prepared by Sputtering
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2810-2812
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- August 2020
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Characterisation Techniques for the Identification of Composite Cladding Materials
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 744-745
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- August 2019
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SD-WDS: Bremsstrahlung Determination by Theoretical Calculation and Subsequent Estimation of Mass Attenuation Coefficients
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2316-2317
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- August 2019
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Understanding your Material Better – Low Voltage Imaging, Analysis and X-ray Mapping - Applications and Points to Consider
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 470-471
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- August 2019
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Next Generation of Instruments Required - Not just X-Ray Imaging but Combined EDS, CL, GSR, XRM, XRD and Raman Systems
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 996-997
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- August 2018
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SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 756-757
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- August 2018
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Effect of Oxygen on Sputtered Tantalum Nitride Thin Films for Photoelectrochemical Water Splitting
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1546-1547
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- August 2018
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Detection and Characterization of Heavy-Metal-Free (HMF) Gunshot Residues Using CL, EDS and Raman Together with XRD
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1174-1175
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- August 2018
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Characterisation of Acid Resistant Concrete Exposed to Sulphuric Acid Using SEM, EDS and X-Ray Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1076-1077
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- July 2017
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Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1048-1049
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- July 2017
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Phenom Desktop SEM for Gunshot Residue and Cathodoluminescence Imaging and Analysis
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1074-1075
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- July 2017
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Current State of Combined EDS-WDS Quantitative X-Ray Mapping
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 92-93
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- July 2016
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X-ray Mapping Characterisation of Materials that have a Large Dynamic Compositional Range
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 114-115
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- July 2016
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Conditions for Low Voltage Microanalysis and X-ray Mapping
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 406-407
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- July 2016
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X-Ray Mapping of an Impact-Resistant Crustacean-Derived Biocomposite
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 98-99
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- July 2016
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Characterisation of Recycled Aggregate Concrete Through X-Ray Mapping
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 124-125
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- July 2016
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Aluminum and Tantalum Doping of Sputtered TiO2 Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1799-1800
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- August 2015
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