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Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 576-577
- Print publication:
- August 2013
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Nanowire Characterization for Photonic Properties
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1968-1969
- Print publication:
- August 2005
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