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Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 336-337
- Print publication:
- July 2012
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High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 794-795
- Print publication:
- July 2011
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