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Importance of the Protective Layers and the Specimen Preparation for Reproducible APT Results
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 730-731
- Print publication:
- July 2011
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Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 282-283
- Print publication:
- July 2009
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