The impact
of light and medium mass ions in crystals in the MeV
range is of particular interest in high energy implantations. In the present
work, extensive continuous wave (cw) and pulsed electron paramagnetic
resonance (EPR) studies of a 21R SiC Lely platelet, after
irradiation with 8 MeV 7Li2+ ions in the random
direction, up to a maximum dose of approximately 1 × 1016
particles/cm2 are presented. The existence of new types of defects
induced in the end-of-range region of impinging ions is discussed and
analyzed. Due to the complexity of the induced structure, the technique
of progressive annealing was utilized, revealing interesting features
in the experimental spectra. The results are compared to known
literature and an attempt is made to explain the occurring
similarities. Furthermore, a new paramagnetic defect was isolated and
analyzed, persisting up to 1100 °C during the annealing
procedure.