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Site specific He ion irradiation damage studies in nanolayered thin films by cross-coupling Helium Ion Microscopy with TEM and APT
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 816-817
- Print publication:
- July 2012
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- Article
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