4 results
TEM Studies of Synthetic Anti-Ferromagnetic (SAF) Nanoparticles
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 622-623
- Print publication:
- August 2007
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Cone-Shaped Thickness Standard Made by Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1314-1315
- Print publication:
- August 2006
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A Method of Lifting-out FIB prepared TEM-ready Specimen
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1312-1313
- Print publication:
- August 2006
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Extension Tip of Lift-Out Probe in FIB Systems
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1316-1317
- Print publication:
- August 2006
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