Recent advances in imaging techniques capable of light microscopy resolutions below the Abbe diffraction limit have challenged microscopy equipment designers to pursue conflicting goals for components such as sample positioning and scanning stages and focusing mechanisms. For the super-resolution light microscopy, the positions of these components must be controlled in more degrees of freedom with higher dynamic and static accuracy, yet emerging applications demand higher speeds, finer resolutions, tighter synchronization, nanoscale stabilities, and longer travels to meet scientific and optical requirements. Meanwhile the practicality of today's tight budgetary situations cannot be overlooked, both in terms of purchase price and process throughput. Furthermore, of course, compactness is prized to facilitate close working distances and dense optical configurations.