15 results
Correlative Analysis in the Semiconductor Industry
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2502-2503
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- August 2019
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Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1860-1861
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- July 2010
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Ion Beam Nanodissection for 3D Compositional Mapping of Mammalian Cells
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 180-181
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- July 2010
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Atom Probe Tomography of Mammalian Cells: Advances in Specimen Preparation
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 482-483
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- July 2010
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Wide-Field-of-View Atom Probe Reconstruction
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 292-293
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- July 2009
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TEM and Atom Probe Tomography Characterization of High TMR MgO-Based Magnetic Tunnel Junctions
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 278-279
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- July 2009
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Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 298-299
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- July 2009
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Field Evaporation of Octadecanethiol
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 300-301
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- July 2009
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A System for Simulation of Tip Evolution Under Field Evaporation
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 302-303
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- July 2009
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Development of Atom Probe Tomography for Biological Materials
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 582-583
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- July 2009
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Performance Improvements of Local Electrodes from In-situ Plasma Cleaning
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 286-287
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- July 2009
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Analysis of Bulk Dielectrics with Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1254-1255
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- August 2008
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Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1230-1231
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- August 2008
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Observations of Cluster Ions Originating from Non-Traditional Atom Probe Materials
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1236-1237
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- August 2008
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Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1738-1739
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- August 2006
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