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Characterization of Al In GaN/GaN Heterointerface by HAADF-STEM and Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 438-439
- Print publication:
- August 2008
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Novel Oxides for Passivating AlGaN/GaN HEMT and Providing Low Surface State Densities at Oxide/GaN Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C4.1
- Print publication:
- 2003
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- Article
- Export citation