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Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy using Precession Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1484-1485
- Print publication:
- July 2017
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- Article
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Optical and electrical study of cap layer effect in QHE devices with double-2DEG
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1617 / 2013
- Published online by Cambridge University Press:
- 19 November 2013, pp. 31-36
- Print publication:
- 2013
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- Article
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