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In-Situ Observation and Characterization of Structural Evolution in a Phase-Change Memory Device by TEM-STM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 716-717
- Print publication:
- July 2009
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- Article
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In-situ Observation of Structural Change and Failure Detection for Electrically Active Devices in TEM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 808-809
- Print publication:
- August 2007
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