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Nanometer Thermal Conductivity Mapping Using Laser-based Scanning Thermal Microscopy
- Jeremy Goeckeritz, Gary Aden, Ami Chand
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1754 / 2015
- Published online by Cambridge University Press:
- 24 March 2015, pp. 81-86
- Print publication:
- 2015
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A new measurement technique using a cantilever probe with an integrated thermal sensor is investigated for measuring thermal conductivity at the nanometer scale. The probe is used in a configuration wherein the laser from an atomic force microscope (AFM) heats the tip of the probe above ambient temperature. Heat is transferred from the probe to a sample based on the thermal conductivity of the sample. The heat flow creates a temperature change, as small as 0.01 °C, which is detected by the thermal sensor. The measurement technique presented offers a simple and effective method for mapping the thermal conductivity of a number of materials. We explore the ability of the technique to map silicon oxide on silicon, carbon fibers and gold nanoparticles. Analysis shows that the technique can be used to produce images with a thermal resolution surpassing 25 nm.
Contributors
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- By Rose Teteki Abbey, K. C. Abraham, David Tuesday Adamo, LeRoy H. Aden, Efrain Agosto, Victor Aguilan, Gillian T. W. Ahlgren, Charanjit Kaur AjitSingh, Dorothy B E A Akoto, Giuseppe Alberigo, Daniel E. Albrecht, Ruth Albrecht, Daniel O. Aleshire, Urs Altermatt, Anand Amaladass, Michael Amaladoss, James N. Amanze, Lesley G. Anderson, Thomas C. Anderson, Victor Anderson, Hope S. Antone, María Pilar Aquino, Paula Arai, Victorio Araya Guillén, S. Wesley Ariarajah, Ellen T. Armour, Brett Gregory Armstrong, Atsuhiro Asano, Naim Stifan Ateek, Mahmoud Ayoub, John Alembillah Azumah, Mercedes L. García Bachmann, Irena Backus, J. Wayne Baker, Mieke Bal, Lewis V. Baldwin, William Barbieri, António Barbosa da Silva, David Basinger, Bolaji Olukemi Bateye, Oswald Bayer, Daniel H. Bays, Rosalie Beck, Nancy Elizabeth Bedford, Guy-Thomas Bedouelle, Chorbishop Seely Beggiani, Wolfgang Behringer, Christopher M. Bellitto, Byard Bennett, Harold V. Bennett, Teresa Berger, Miguel A. 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- Edited by Daniel Patte, Vanderbilt University, Tennessee
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- The Cambridge Dictionary of Christianity
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- 05 August 2012
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- 20 September 2010, pp xi-xliv
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The NSOM Technique And It's Significance
- Gary Aden
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- Journal:
- Microscopy Today / Volume 2 / Issue 2 / March 1994
- Published online by Cambridge University Press:
- 14 March 2018, p. 4
- Print publication:
- March 1994
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Prior to Near-Field Scanning Optical Microscopy (NSOM) there were two major light microscopy techniques; optical and confocal.
In an optical microscope a sample is illuminated with a flood of light. The lighted area is then imaged and magnified by collecting the light that is either reflected from or transmitted through the sample by a series of glass lenses. A color magnified image of the sample may be seen directly or displayed on a TV screen. Even if the lenses could be made perfectly, the resolution and magnification of an optical microscope are limited by diffraction effects to approximately one half of the wavelength of the light that is used. Optical microscopes are used routinely to image the general shape of samples as small as human chromosomes or compact disk bits.
Parameters Affecting X-Ray Microfluorescence (XRMF) Analysis
- Monte C. Nichols, Dale R. Boehme, Richard W. Ryon, David Wherry, Brian Cross, Gary Aden
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- Journal:
- Advances in X-ray Analysis / Volume 30 / 1986
- Published online by Cambridge University Press:
- 06 March 2019, pp. 45-51
- Print publication:
- 1986
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X-ray Microfluorescence (XRMF) analysis uses a finely collimated beam of X-rays to excite fluorescent radiation in a sample (Nichols & Ryon 1986). Characteristic fluorescent radiation emanating from the small interaction volume element is acquired using an energy dispersive detector placed in close proximity to the sample. The signal from the detector is processed using a computer-based multi-channel analyzer.
XRMF imaging is accomplished by translating the sample through the small X-ray beam in a step or continuous raster mode. As the sample is translated, a pixel by pixel X-ray intensity image is formed for each chemical element in the sample. The resulting digitized image information for each element is stored for subsequent processing and/or display. The images, in the form of elemental maps representing identical areas, may be displayed and color coded by element and/or intensity and then overlayed for spatial correlation.
The present study of parameters affecting the performance of an X-ray microfluorescence system has shown how such systems use X-ray beams with effective spot sizes less than 100 micrometers to bridge the gap in analytical capabilities between predominately surface micro analytical techniques such as SEM/EDX and bulk analytical methods such as standard XRF analysis. The combination of XRMF spectroscopy with digital imaging allows chemical information to be obtained and mapped from surface layers as well as from layers or structures beneath the sample surface. Simultaneously, it provides valuable high resolution chemical information in a readily interpreted visual form which displays the homogeneity within a given layer or structure. XRMF systems retain the advantages of minimal sample preparation, non-destructive analysis and high sensitivity inherent to XRF methods.