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28 results

Page 1 of 2

  • High Throughput Tender 3D X-ray Imaging of Cells for Correlative Microscopy

  • Katarzyna Matusik, Sylvia Lewis, David Vine, Jeff Gelb, S.H. Lau
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 1058-1059
    Print publication:
    August 2020
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  • Energy Tunability in Laboratory 3D Nano-XRM

  • Jeff Gelb, David Vine, Trevor Lancon, Sylvia Lewis, SH Lau, Wenbing Yun
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 388-389
    Print publication:
    August 2019
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  • Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF

  • Jeff Gelb, Benjamin Stripe, Xiaolin Yang, Sylvia Lewis, SH Lau, Wenbing Yun
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 1058-1059
    Print publication:
    August 2018
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  • Advancements in X-Ray Analysis for Correlative Microscopy

  • Jeff Gelb, Sylvia Lewis, SH Lau, Janos Kirz, Wenbing Yun
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 358-359
    Print publication:
    August 2018
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  • A 4D Framework for Probing Structure-Property Relationships in Lithium Ion Batteries

  • Jeff Gelb, Donal Finegan, Melanie McNeil, Dan Brett, Paul Shearing
  • Journal:
    / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 2102-2103
    Print publication:
    July 2017
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  • Correlative Microscopy in 3D: Recent Advancements in Multi-Scale Materials Science

  • Jeff Gelb, Tobias Volkenandt, Arno Merkle
  • Journal:
    / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 332-333
    Print publication:
    July 2017
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  • Linking Length Scales and Modalities with Integrated, Correlative Microscopy

  • Jeff Gelb, Will Harris, Lorenz Lechner, Arno Merkle
  • Journal:
    / Volume 22 / Issue S3 / July 2016
    Published online by Cambridge University Press:
    25 July 2016, pp. 238-239
    Print publication:
    July 2016
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  • Recent Advancements in 3D X-ray Microscopes for Additive Manufacturing

  • Leah Lavery, William Harris, Jeff Gelb, Arno Merkle
  • Journal:
    / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 131-132
    Print publication:
    August 2015
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  • Characterizing Failure in Commercial Li-Ion Batteries with 4D X-Ray Microscopy

  • Jeff Gelb, Paul Shearing, Donal Finegan, Dan Brett
  • Journal:
    / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 447-448
    Print publication:
    August 2015
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  • 3D X-ray Microscopy: A New High Resolution Tomographic Technology for Biological Specimens

  • Leah Lavery, Arno Merkle, Jeff Gelb
  • Journal:
    / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 925-926
    Print publication:
    August 2015
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Page 1 of 2