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A Comparison of the Electronic Structure of N-K in TiN and VN using EELS and Ab-initio Calculations
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 414-415
- Print publication:
- September 2007
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Microstructure and Characterization of CuAlNi Shape Memory Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1320-1321
- Print publication:
- August 2002
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