8 results
Adaptive Phenotypic Plasticity of Siberian Elm in Response to Drought Stress: Increased Stomatal Pore Depth
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S5 / August 2013
- Published online by Cambridge University Press:
- 06 August 2013, pp. 178-181
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- August 2013
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Micromorphology of Epicuticular Waxes and Epistomatal Chambers of Pine Species by Electron Microscopy and White Light Scanning Interferometry
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 1 / February 2011
- Published online by Cambridge University Press:
- 19 November 2010, pp. 118-124
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- February 2011
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Clinical Epidemiology of Ciprofloxacin Resistance and Its Relationship to Broad-Spectrum Cephalosporin Resistance in Bloodstream Infections Caused by Enterobacter Species
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- Journal:
- Infection Control & Hospital Epidemiology / Volume 26 / Issue 1 / January 2005
- Published online by Cambridge University Press:
- 21 June 2016, pp. 88-92
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- January 2005
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Risk Factors for and Clinical Outcomes of Bloodstream Infections Caused by Extended-Spectrum Beta-Lactamase-Producing Klebsiella pneumoniae
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- Journal:
- Infection Control & Hospital Epidemiology / Volume 25 / Issue 10 / October 2004
- Published online by Cambridge University Press:
- 02 January 2015, pp. 860-867
- Print publication:
- October 2004
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Impact of Low k Dielectrics on Electromigration Reliability for Cu Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 766 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E1.6
- Print publication:
- 2003
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Electromigration Study of Cu Dual-damascene Interconnects with a CVD MSQ Low k Dielectric
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- Journal:
- MRS Online Proceedings Library Archive / Volume 766 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E1.9
- Print publication:
- 2003
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Electromigration in Submicron Dual-damascene Cu/low-k Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B12.9
- Print publication:
- 2002
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Electromigration Reliability of Dual-Damascene Cu/Oxide Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D2.3.1
- Print publication:
- 2000
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