11 results
FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films
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- Journal:
- MRS Advances / Volume 1 / Issue 49 / 2016
- Published online by Cambridge University Press:
- 13 June 2016, pp. 3361-3366
- Print publication:
- 2016
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Exploration of the Scaling Limits of 3D Integration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 970 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0970-Y02-01
- Print publication:
- 2006
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Materials and Physical Properties of Novel High-k and Medium-k Gate Dielectrics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 670 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, K1.1
- Print publication:
- 2001
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Optical and Structural Characterization of Nanocrystalline Silicon Superlattices: Toward Nanoscale Silicon Metrology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 638 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, F5.1.1
- Print publication:
- 2000
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Optical Properties of Thin-Film SrTiO3 on Si Grown by MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 619 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, 167
- Print publication:
- 2000
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Dielectric Function of AlN Grown on Si (111) by MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 231
- Print publication:
- 1999
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Raman Spectroscopy of Epitaxial Si/Si1-xGe, xHeterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 533 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 63
- Print publication:
- 1998
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Ellipsometry Studies, Optical Properties, And Band Structure of Gel.1-yCy, Ge-RICH Si1-x-yGexCy, And Boron-Doped Si1-xGexAlloys
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- Journal:
- MRS Online Proceedings Library Archive / Volume 533 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 125
- Print publication:
- 1998
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Raman and Spectroscopic Ellipsometry Studies of P-Doped Poly-Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 957
- Print publication:
- 1998
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Spectroscopic Ellipsometry and Band Structure of Si1–yCy Alloys Grown Pseudomorphically on Si (001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 379 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 205
- Print publication:
- 1995
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Optical Properties of Microcrystalline Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 164 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 229
- Print publication:
- 1989
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