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Measurement of the Refraction Correction for Asymmetric Grazing Incidence Xrd From Rough Surfaces and Powders

Published online by Cambridge University Press:  06 March 2019

T. Ely ,
P. K. Predecki ,
X. Zhu ,
M. Eatough ,
R. Goehner  and
R. Lucernoni
T. Ely
Affiliation:
University of Denver, Denver, CO
P. K. Predecki
Affiliation:
University of Denver, Denver, CO
X. Zhu
Affiliation:
Oak Ridge National Lab, Oak Ridge, TN
M. Eatough
Affiliation:
Sandia National Lab, Albuquerque, NM
R. Goehner
Affiliation:
Sandia National Lab, Albuquerque, NM
R. Lucernoni
Affiliation:
Coors Ceramics Co., Golden, CO
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Abstract

The refraction effect at small incidence angles was investigated for solid Al2O3 disks of varying surface roughness, and Al2O3 and LaB6 powder layers of varying thickness and roughness using pseudo parallel beam optics. For the disks the peak shift Δ2θ correlated approximately inversely with ζmax, the maximum slope of a sinusoidal model of the surface roughness. For a disk polished with 3θm diamond, Δ2θ exceeded that predicted by the James equation. For the powder layers Δ2θ was very small for the thinnest layers. For thicker, rougher layers Δ2θ was larger and was probably due to displacement error from the 0.4° divergence of the Soller slit used and specular reflection of the diffracted beam from the Soller slit leaves.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 381 - 389
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

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