Hostname: page-component-848d4c4894-p2v8j Total loading time: 0 Render date: 2024-06-12T07:41:45.896Z Has data issue: false hasContentIssue false

Analysis of Diffraction Contrast as A Function of Energy Loss in Energy Filtering Transmission Electron Microscope (EFTEM) Imaging and Possible Implications on High-Resolution Compositional Mapping

Published online by Cambridge University Press:  02 July 2020

K.T. Moore
Affiliation:
Department of Earth and Planetary Sciences, Johns Hopkins University, Baltimore, MD21218, U.S.A.
J.M. Howe
Affiliation:
Department of Material Science and Engineering, University of Virginia, Charlottesville, VA22903-2442, U.S.A.
Get access

Extract

The dependence of diffraction contrast on electron energy loss is an important relationship that needs to be understood because of its potential effect on energy-filtering transmission electron microscope (EFTEM) images. Often when either a two-window jump-ratio image or a three-window elemental map is produced diffraction contrast is not totally eliminated and contributes to the intensity of the final EFTEM image. Background removal procedures often are unable to completely account for intensity changes due to dynamical effects (i.e., elastic scattering) that occur between images acquired at different energy losses, leaving artifacts in the final EFTEM image.

In this study, the relationship between diffraction contrast and electron energy loss was investigated by obtaining EFTEM images of a bend contour in aluminum in 100 eV increments from 0 to 1000 eV (Fig. 1). EFTEM images were acquired a JOEL 2010F FEG TEM with a Gatan imaging filter (GIF) at a microscope magnification of 8 kX using a 1 eV/pixel dispersion, 2X binning (512 x 512) and exposure times ranging from 0.25 s for 0 eV energy loss up to 132 sec for 1000 eV energy loss.

Type
Compositional Imaging and Spectroscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press, New York (1996) 322345.CrossRefGoogle Scholar
2.Reimer., L.in Energy-Filtering Transmission Electron Microscopy, Reimer ed., L.Springer- Verlag, Berlin (1995) 347393.CrossRefGoogle Scholar
3.Howe, J.M.et.alPhil. Mag. A, 56 (1987) 31.CrossRefGoogle Scholar
4.Rohrer, C.L.et.alActa metall. mater., 43 (1995) 2097.CrossRefGoogle Scholar
5.Shuman, H.et.alUltramicroscopy, 19 (1986) 121.CrossRefGoogle Scholar
6. This work was supported by the National Science Foundation under Grant DMR-9630092.Google Scholar