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Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  07 August 2002

S.J. Pennycook*
Affiliation:
Solid State Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6030
B. Rafferty
Affiliation:
Solid State Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6030 Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
P.D. Nellist
Affiliation:
Nanoscale Physics Research Laboratory, School of Physics and Astronomy, The University of Birmingham, Birmingham, B15 2TT, UK
*
*Corresponding author
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Abstract

We show that in the limit of a large objective (probe-forming) aperture, relevant to a spherical aberration corrected microscope, the Z-contrast image of a zone-axis crystal becomes an image of the 1s Bloch states. The limiting resolution is therefore the width of the Bloch states, which may be greater than that of the free probe. Nevertheless, enormous gains in image quality are expected from the improved contrast and signal-to-noise ratio. We present an analytical channeling model for the thickness dependence of the Z-contrast image in a zone-axis crystal, and show that, at large thicknesses, columnar intensities become proportional to the mean square atomic number, Z2.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2000

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