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Bonding Regeneration: The Driving Force of Hetero-Epitaxial Diamond Grain Coalescence on (001) Silicon

Published online by Cambridge University Press:  10 February 2011

R.Q. Zhang ,
X. Jiang ,
C.L. Jia  and
S.-T. Lee
R.Q. Zhang
Affiliation:
Department of Physics and Materials Science, City University of Hong Kong, Hong Kong
X. Jiang
Affiliation:
Fraunhofer-Institut fuer Schicht- und Oberflaechentechnik (FhG-IST), Bienroder Weg 54 E, D-38108 Braunschweig, Germany
C.L. Jia
Affiliation:
Institut fuer Festkorperforschung, Forschungszentrum Julich GmbH, D-52425 Julich, Germany
S.-T. Lee
Affiliation:
Department of Physics and Materials Science, City University of Hong Kong, Hong Kong
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Abstract

The grain coalescence phenomenon in the growth of heteroepitaxial diamond film on (001) silicon substrate by microwave plasma chemical vapor deposition was examined by using high-resolution electron microscopy. It was shown that this phenomenon evidently occurs between two diamond grains with a small-angle tilt. The coalescence was completed after some more growth steps following the meeting of such two grains, indicating the difficulty for the lattice matching in grain boundary. By performing simulation of a step-by-step growth of two diamond grains on a (001) silicon substrate with molecular orbital PM3 method, it was shown that the bonding regeneration between the two grains is essential for the coalescence and the coalescence is only possible when the orientation difference between the grains is sufficiently small so as to allow efficient overlap of electron cloud in the grain boundary. This study indicates that single crystal diamond growth may be possible by the current CVD growth techniques via further reduction of the surface roughness to gain a heteroepitaxy with very small grain tilting.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 529: Symposia BB – Computational & Mathematical Models of Microstructural Evolution , 1998 , 133
Copyright
Copyright © Materials Research Society 1998

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