YBi2O3.5+δSe1-xClx: A family of semiconductors with a charge- and defect-tunable triple fluorite layer

16 January 2026, Version 1
This content is an early or alternative research output and has not been peer-reviewed by Cambridge University Press at the time of posting.

Abstract

Abstract: The design and development of new materials is crucial for advanced next-generation technologies, necessitating the modification of materials with tuneable atomic and electronic frameworks. This is often achieved by addition or replacement of metals and cations. Substitution of anions is also possible; here, we present the YBi2O3.5+δSe1-xClx family which represent a new class of layered mixed anionic semiconductor materials with complete substitution of Cl by Se charge balanced by the introduction of oxide vacancies. The introduction of Se anions into the visible band gap material YBi2O4Cl shifts the band gap from 2.4 to 1.2 eV. This coupled Se/Cl substitution with O vacancy generation enables defect-engineered, tuneable new layered materials with tailored electronic properties in the visible band gap region, opening new pathways for development of semiconductors, thermoelectrics, and mixed oxide ion conductors

Keywords

Heteroanion
Layered Materials
Semiconductor

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