Symposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Research Article
STM Image Simulation: Effect of the Number of Tunneling States and the Isosurface Value
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- 01 February 2011, O10.1
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Frequency Response of Microcantilevers in Viscous Fluids
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- 01 February 2011, O10.17
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Atomically Resolved Imaging of Epitaxial CaF2 on Si(111) using Noncontact Atomic Force Microscope
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- 01 February 2011, O1.9
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High-Resolution Photochemical Reaction Using Triplet-Sensitizer Probes
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- 01 February 2011, O14.6
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Near-Field Scanning Optical Microscopy of Phase Separation Effects in Dilute Nitride Alloys.
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- 01 February 2011, O3.1
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Ballistic Electron Emission Luminescence of InAs Quantum Dots Embedded in a GaAs/AlxGa1−xAs Heterostructure
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- 01 February 2011, O11.2
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Apertureless head: a multipurpose tool really combining atomic force microscopy with powerful means for optical investigations.
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- 01 February 2011, O4.3
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Optical near-field enhancement around lithographic metallic nanostructures using an azo-dye polymer: direct observation and realization of sub-wavelength complex structures
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- 01 February 2011, O5.2
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Quantitative and Nanoscale Surface Potential Tracking of Ionic and Organic Adsorbates at sub-Monolayer Coverage
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- 01 February 2011, O1.10
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Electronic Properties of Modified Surfaces Using Contact and Non-Contact Scanning Probe Microscopy Techniques and SECM.
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- 01 February 2011, O15.3
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Effects of Surface Functionality and Humidity on the Adhesion Force And Chemical Contrast Measured with AFM
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- 01 February 2011, O15.5
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Scanning Conductance Microscopy and High Frequency Scanning Gate Microscopy of Carbon Nanotubes and Polyethylene based Nanofibers
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- 01 February 2011, O9.8
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TEM investigation of nucleation and initial growth of ZnSe nanowires
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- 01 February 2011, O14.11
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Electrical characterization using Scanning Capacitance Microscopy of the local electronics properties of Ge semiconductor nanostructures.
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- 01 February 2011, O10.12
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Archaeological Copper Smelting at Itziparátzico, Michoacan, Mexico
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- 01 February 2011, O1.1
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A Scanning Tunneling Microscopy Study: Si/SiO2 Interface Roughness Induced by Chemical Etching
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- 01 February 2011, O4.9
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Radiation Induced Subsurface Charging in the Buried Oxide Layer in SIMOX
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- 01 February 2011, O6.2
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Atomically Resolved STM Images of CVD Grown Carbon Nanotubes
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- 01 February 2011, O10.2
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The μ-TA (Scanning Thermal Mcroscopy) - a tool for quantitative surface analysis and surface treatment
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- 01 February 2011, O15.7
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Semiconductor Dopant Profile and Dielectric Characterization with Scanning Capacitance Microscopy
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- 01 February 2011, O9.1
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