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Epitaxial growth of semiconducting LaVO3 thin films
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- 31 January 2011, pp. 1-3
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Phase selection during solidification of undercooled bulk Bi95Sb5 melts
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- 31 January 2011, pp. 4-6
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Hydrogen-enhanced dislocation velocities in Ni3Al single crystals
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- 31 January 2011, pp. 7-9
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Fabrication of cellular NiTi intermetallic compounds
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- 31 January 2011, pp. 10-13
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Significant reduction in thermal expansion of a low-carbon steel sheet by depositing a Fe–Ni alloy thin film
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- 31 January 2011, pp. 14-16
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Fracture origins in LiNbO3 wafers due to postprocessing micro-repolarization
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- 31 January 2011, pp. 17-20
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Optical and electrical properties of transparent conducting In2O3–ZrO2 films
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- 31 January 2011, pp. 21-24
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Diamond synthesis by high-velocity thermal spray: The laboratory analogue of a meteorite impact
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- 31 January 2011, pp. 25-28
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Synthesis of crack-free thick diamond wafer by step-down control of deposition temperature
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- 31 January 2011, pp. 29-32
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Fabrication and characterization of large Nd–Ba–Cu–O grains prepared under low oxygen pressure
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- 31 January 2011, pp. 33-39
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Lattice parameters and thermal expansion of GaN
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- 31 January 2011, pp. 40-44
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X-ray diffraction and transmission electron microscopy analysis of ordering and structure in Al1−xInxAs thin films
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- 31 January 2011, pp. 45-55
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Icosahedral nanophases in the Al–Mn–Ce system
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- 31 January 2011, pp. 56-62
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Micropyretic synthesis of NiAl containing Ti and B
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- 31 January 2011, pp. 63-75
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Nondestructive evaluation of cavitation in an Al–Mg material deformed under creep conditions
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- 31 January 2011, pp. 76-84
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Influence of dendrite arm spacing on the thermal conductivity of an aluminum-silicon casting alloy
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- 31 January 2011, pp. 85-91
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Pyrocarbon anisotropy as measured by electron diffraction and polarized light
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- 31 January 2011, pp. 92-101
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Influence of reduction mechanism on the morphology of cobalt nanoparticles in a silica-gel matrix
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- 31 January 2011, pp. 102-106
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Fracture mode of alumina/silicon carbide nanocomposites
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- 31 January 2011, pp. 107-114
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Domain structure and electrical properties of highly textured PbZrxTi1−xO3 thin films grown on LaNiO3-electrode-buffered Si by metalorganic chemical vapor deposition
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- 31 January 2011, pp. 115-124
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