Summary
In this chapter we addressed the central issues involved in test consistency:
reliability, dependability, and fit. We argued that these consistency
issues arise because there is always some error in test scores. Estimating
just how much that error contributes to the scores of examinees revolves
around notions of reliability in norm-referenced testing, dependability
in Criterion-referenced testing, and fit in item response theory.
NRT reliability was shown to be heavily dependent upon correlational
approaches. Thus we necessarily provided a brief explanation of how the
Pearson product-moment correlation coefficient is calculated and interpreted.
Three basic correlational approaches were then explained: test-retest
reliability, equivalent forms reliability, and internal consistency reliabilities
(including split-half adjusted by the Spearman-Brown prophecy formula,
alpha, K-R20, K-R21, and standard error of measurement).
CRT dependability estimation, which typically focuses on the consistency
of test-based decisions about examinees absolute knowledge, was
classified into two general approaches: the threshold-loss methods and
generalizability theory approaches. The threshold-loss methods included
the original agreement and kappa coefficients based on two administrations
of a CRT, and Subkoviaks (1980) methods that allowed for estimating
the agreement and kappa coefficients from a single administration of a
test. The generalizability theory approaches included discussion of the
domain score approach, including phi (F) and the confidence interval.
The squared-error loss approaches covered Livingstons statistic,
symbolized as k2(XT), and the more effective phi(lambda), symbolized as
F(l).
IRT concerns with consistency were conceptualized somewhat differently
from those of NRT and CRT. For IRT, the key concept was unidimensionality.
In essence, the idea was that a single trait should be measured in each
test (or subtest). This was shown to be a useful concept for CRT in that
CRT is generally concerned with measuring well-defined domains of homogeneous
content. Factor analysis was shown to be one approach for establishing
unidimensionality in tests. Several approaches to estimating data-to-model
fit were also described.
The chapter ended with a brief discussion of some of the relationships
among NRT reliability estimates and CRT dependability indexes in terms
of what they mean for quick-down-and-dirty estimates of CRT dependability.
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