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Microstructure and optical loss in epitaxial (Pb, La)TiO3 thin films on (001) MgO

Published online by Cambridge University Press:  31 January 2011

Young Min Kang
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790–784, Korea
Sunggi Baik
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790–784, Korea
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Abstract

Surface morphologies and microstructures of epitaxial (Pb1−xLax)TiO3 (PLT, x = 0.00, 0.08, 0.16, and 0.24) thin films grown on (001) MgO have been investigated using SEM, AFM, and TEM. Surface roughness of PLT films varies severely with La concentration. For 0.08La-PLT film, very smooth surface has been achieved with 9.3 Å of RMS roughness. 0.00La- and 0.08La-PLT films show 90° domain structure, and periodic dimension of the domain is reduced by La substitution. 0.16La- and 0.24La-PLT films show the presence of triangular grains, causing rough surface and poor crystal quality. However, they are distributed uniformly in 0.16La-PLT film while agglomerated in 0.24La-PLT film. Optical propagation losses of PLT films measured by prism coupling technique were 22.3, 6.0, 11.4, and 20.7 dB/cm for x = 0.00, 0.08, 0.16, and 0.24, respectively. Such a variation in optical losses seemed to be due to the surface morphology and abundance of domain boundaries that change continuously as a function of La concentration in epitaxial PLT thin films.

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Articles
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1.Nishihara, H., Haruna, M., and Suhara, T., Optical Integrated Circuits (McGraw-Hill, New York, 1989), p. 360.Google Scholar
2.Fork, D. K., Armani-Leplingard, F., and Kingston, J. J., in Ferroelectric Thin Films IV, edited by Tuttle, B. A., Desu, S. B., Ramesh, R., and Shiosaki, T. (Mater. Res. Soc. Symp. Proc. 361, Pittsburgh, PA, 1995), p. 155.Google Scholar
3.Adachi, H. and Wasa, K., IEEE Trans. Ultrason., Ferroelectrics, Freq. Control 38, 645 (1991).CrossRefGoogle Scholar
4.Kang, Y. M., Ku, J. K., and Baik, S., in Ferroelectric Thin Films IV, edited by Tuttle, B. A., Desu, S. B., Ramesh, R., and Shiosaki, T. (Mater. Res. Soc. Symp. Proc. 361, Pittsburgh, PA, 1995), p. 569.Google Scholar
5.Kim, Y., Erbil, A., Boatner, L. A., Steingart, L., Mensah, T., and Hiamang, S., in Epitaxial Oxide Thin Films II, edited by Fork, D. K., Speck, J. S., Shiosaki, T., and Wolf, R. M. (Mater. Res. Soc. Symp. Proc. 401, Pittsburgh, PA, 1996), p. 267.Google Scholar
6.de Keijser, M., Dormans, G. J. M., Cillessen, J. F. M., deLeeuw, D. M., and Zandbergen, H. W., Appl. Phys. Lett. 58, 2636 (1991).CrossRefGoogle Scholar
7.Kwak, B. S., Erbil, A., Wilkens, B. J., Budai, J. D., Chisholm, M. F., and Boatner, L. A., in Ceram. Transactions: Ferroelectric Films, edited by Bhalla, A. S. and Nair, K. M. (Am. Ceram. Soc. Symp. Proc. 25, 1992), p. 203.Google Scholar
8.Seifert, A., Lange, F. F., and Speck, J. S., J. Mater. Res. 10, 680 (1995).CrossRefGoogle Scholar
9.Kang, Y. M., Ku, J. K., and Baik, S., J. Appl. Phys. 78, 2601 (1995).CrossRefGoogle Scholar
10.Tein, P. K., Appl. Opt. 10, 2395 (1971).CrossRefGoogle Scholar
11.Agostinelli, J. A., Braunstein, G. H., and Blanton, T. N., Appl. Phys. Lett. 63, 123 (1993).CrossRefGoogle Scholar
12.Walker, F. J., McKee, R. A., Yen, H-W., and Zelmon, D. E., Appl. Phys. Lett. 65, 1495 (1994).CrossRefGoogle Scholar
13.Kang, Y. M., Lee, K. S., and Baik, S., Ferroelectrics 196, 5 (1997).CrossRefGoogle Scholar
14.Walker, F. J., McKee, R. A., Pennycook, S. J., and Thundat, T. G., in Epitaxial Oxide Thin Films II, edited by Fork, D. K., Speck, J. S., Shiosaki, T., and Wolf, R. M. (Mater. Res. Soc. Symp. Proc. 401, Pittsburgh, PA, 1996), p. 13.Google Scholar
15.Adachi, H., Mitsuyu, T., Yamasaki, O., and Wasa, K., J. Appl. Phys. 60, 736 (1986).CrossRefGoogle Scholar