Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-29T23:50:50.770Z Has data issue: false hasContentIssue false

Properties of Porous AlN Multilayered Ceramic Sandwich Substrates

Published online by Cambridge University Press:  31 January 2011

F. Y. C. Boey
Affiliation:
School of Materials Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore
A. I. Y. Tok
Affiliation:
School of Materials Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore
Y. Long
Affiliation:
School of Materials Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore
H. Y. Yeong
Affiliation:
School of Materials Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore
Get access

Extract

The development of denser and higher powered integrated circuits has led to a corresponding demand on the performance of dielectric substrates. This paper reports on the fabrication and properties of an AlN multilayered sandwich substrate comprising porous tape-cast layers sandwiched between nonporous layers. Tapes were produced by nonaqueous tape casting, with the porous tapes produced using polymer microspheres as sacrificial molds. Starting from initially Al2O3-rich tapes, the multilayered sandwich substrates were reaction sintered to produce AlN substrates. No interface cracking or delamination was observed in the substrates as a result of the processing. The added porosity resulted in a decrease in the substrate dielectric constant in correspondence to porosity volume. Mechanical strength of the sandwich substrates was improved over that of nonsandwich porous substrates, while substrates having noninterconnected pores showing higher mechanical strength than substrates with connected pores. Substrates with more than 2% porosity showed porosity-dependent thermal conductivity values, while thermal conductivity of substrates with less than 2% porosity was dependent on grain boundary effects. Thermal expansion coefficient of the substrates was unaffected by porosity levels.

Type
Articles
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Semiconductor Industry Association, International Technology Roadmap for semiconductors, ITRS Report 1999 Edition (1999).Google Scholar
2.Buchanan, R.C., Ceramic Materials for Electronics: Processing, Properties and Applications (Marcell Decker Inc., New York, 1986).Google Scholar
3.Reed, J.S., Principles of Ceramics Processing (John Wiley & Sons, New York, 1994).Google Scholar
4.Schwartz, B., Am. Ceram. Soc. Bull. 65(7), 10321035 (1986).Google Scholar
5.Chartier, T. and Streicher, E., J. Eur. Ceram. Soc. 9, 231242 (1992).CrossRefGoogle Scholar
6.Haussone, J.M., Mater. Manuf. Processes 10(4), 717755 (1995).Google Scholar
7.Wirth, D., Engineered Materials Handbook (ASTM, West Conshohocken, PA, 1991), Vol. 4 pp. 11071111.Google Scholar
8.Disson, J.P. and Bachelard, R., Ind. Ceram. 896(9), 602606.Google Scholar
9.Shugg, W.T., Handbook of Electrical and Electronic Insulating Materials, 2nd ed. (IEEE, Piscataway, NJ, 1995).CrossRefGoogle Scholar
10.Mohammed, A.A. and Corbert, S.J., Proc. Int. Symp. Microelectron. 218224 (1985).Google Scholar
11.Selvaduray, G. and Sheet, L., Mater. Sci. Technol. 9, 463473 (1993).Google Scholar
12.Boey, F., Cao, L., Khor, K.A., and Tok, A.I.Y.. Acta Mater. (in press).Google Scholar
13.Boey, F.Y.C., Song, X.L., Gu, Z., and Tok, A.I.Y., J. Mater. Process. Technol. 89–90, 478480 (1999).Google Scholar
14.Kellerman, D.W., in Hollow and Solid Spheres and Microspheres: Science and Technology Associated with Their Fabrication and Application (Mat. Res. Soc. Symp. Proc. 372, Pittsburgh, PA, 1995). pp. 239245.Google Scholar
15.Kraft, E.H., Materials and Designs for Advanced MIC Packages (American Institute of Physics, Melville, NY, 1986), pp. 255266.Google Scholar
16.Tok, A.I.Y., Boey, F.Y.C., and Clegg, W.J., J. Mat. Res. (2001, in press).Google Scholar
17.Carprino, G. and Langella, A., J. Comp. Mater. 34(9), 791814 (2000).Google Scholar
18.Bakos, D.J. and Papanicolaou, G.C., Comp. Sci. Technol. 49, 3543 (1993).CrossRefGoogle Scholar
19.Lamy, B. and Dixneuf, E., J. Mater. Sci. Lett. 18, 607608 (1999).Google Scholar
20.Shenbar, Y., Prostig, Y. and Altus, E., Comp. Struct. 35, 143152 (1995).Google Scholar
21.Caprino, G. and Teti, R., Sandwich Structures Handbook (Prato Publications, Prato, Italy, 1989).Google Scholar
22.Vincenzo, M., Sglavo, P., Bosceri, P., Trentini, E., and Ceschini, M., J. Am. Ceram. Soc. 82(8), 22692272 (1999).Google Scholar
23.Huang, Y., Development of hollow polymer microspheres, Master of Engineering Thesis, Nanyang Technological University, Singapore (1999).Google Scholar
24.Tok, A.I.Y., Boey, F.Y.C., and Lam, Y.C., Mater. Sci. Eng. A280, 282288 (2000).Google Scholar
25.Tok, A.I.Y., Boey, F.Y.C., and Khor, K.A., J. Mater. Process. Technol. 89–90, 508512 (1999).Google Scholar
26.Joshi, S.C., Lam, Y.C., Boey, F.Y.C., and Tok, A.I.Y., J. Mater. Process. Technol. (2001).Google Scholar
27.Mackrodt, W.C., in Advances in Ceramics, edited by Cadow, C.R.A. and Mackrodt, E.C. (American Ceramic Society, Westerville, OH, 1987) pp. 293306.Google Scholar
28.Enloe, J.H., Rice, R.W., Lau, J.W., Kumar, R., and Lee, S.Y., J. Am. Ceram. Soc. 74(9), 22142219 (1991).Google Scholar
29.Kuramoto, N., Taniguchi, H. and Aso, I., Am. Ceram. Soc. Bull. 68(4), 833837 (1989).Google Scholar
30.Hill, D. and Clyne, T.W., An Introduction to Composite Materials, 2nd ed. (Cambridge University Press, Cambridge, United Kingdom, 1996).Google Scholar
31.Ryahkewich, E., J. Am. Ceram. Soc. 36(2), 6568 (1953).Google Scholar
32.Duckworth, W., J. Am. Ceram. Soc. 36(2), 69 (1953).Google Scholar