Hostname: page-component-848d4c4894-m9kch Total loading time: 0 Render date: 2024-05-21T07:29:35.939Z Has data issue: false hasContentIssue false

Thermogravimetric analysis of the oxidation of CVD diamond films

Published online by Cambridge University Press:  31 January 2011

Curtis E. Johnson
Affiliation:
Chemistry Division, Research Department, Naval Weapons Center, China Lake, California 93555
Michael A.S. Hasting
Affiliation:
Chemistry Division, Research Department, Naval Weapons Center, China Lake, California 93555
Wayne A. Weimer
Affiliation:
Chemistry Division, Research Department, Naval Weapons Center, China Lake, California 93555
Get access

Abstract

Diamond films grown by microwave plasma assisted chemical vapor deposition (CVD) were studied by thermogravimetric analysis under an air atmosphere. Oxidation rates were measured between 600 and 750 °C to determine an activation energy of 213 kJ/mol which is similar to that reported for natural diamond. The rate of oxidation increases with increasing surface area and decreases with increasing humidity. The oxidation proceeds by etching pits into the film, creating a highly porous structure. Graphitization was not detected in partially oxidized samples by Raman or Auger electron spectroscopy. A film that was heated to 1170 °C under nitrogen remained IR transmissive.

Type
Diamond and Diamond-Like Materials
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Angus, J. C. and Hayman, C. C., Science 241, 913 (1988).CrossRefGoogle Scholar
2DeVries, R.C., Ann. Rev. Mater. Sci. 17, 161 (1987).CrossRefGoogle Scholar
3Evans, T. and Phaal, C., Proc. Conf. Carbon, 5th, Univ. Park, PA, 1961, 1, 147 (1962).Google Scholar
4Johnson, C. E., Weimer, W. A., and Harris, D. C., Mater. Res. Bull. XXIV, 1127 (1989).CrossRefGoogle Scholar
5Johnson, C. E. and Weimer, W. A., in Extended Abstracts No. 19, Technology Update on Diamond Films, edited by Chang, R. P. H., Nelson, D., and Hiraki, A. (Materials Research Society, Pittsburgh, PA, 1989).Google Scholar
6Chang, C.P., Flamm, D.L., Ibbotson, D.E., and Mucha, J.A., J. Appl. Phys. 63, 1744 (1988).CrossRefGoogle Scholar
7Johnson, C. E. and Weimer, W. A., Proc. SPIE 1146, 188 (1989).CrossRefGoogle Scholar
8Solin, S. A. and Ramdas, A. K., Phys. Rev. B 1, 1687 (1970).CrossRefGoogle Scholar
9Knight, D. S. and White, W. A., J. Mater. Res. 4, 385 (1989).CrossRefGoogle Scholar
10Nemanich, R.J., Glass, J.T., Lucovsky, G., and Shroder, R. E., J. Vac. Sci. Technol. A 6, 1783 (1988).CrossRefGoogle Scholar
11Kobashi, K., Nishimura, K., Kawate, Y., and Horiuchi, T., Phys. Rev. B 38, 4067 (1988).CrossRefGoogle Scholar
12 Similar results have been reported elsewhere. Plano, L. S., Yokota, S., and Ravi, K.V., in Proc. 1st Int. Symp. on Diamond and Diamond-like Films, edited by Dismukes, J. P., Purdes, A. J., Meyerson, B. S., Moustakas, T. D., Spear, K. E., Ravi, K.V., and Yoder, M. (Electrochemical Society, Inc., Pennington, NJ, 1989), p. 380.Google Scholar
13Uchida, N., Kurita, T., Uematsu, K., and Saito, K., J. Mater. Sci. Lett. 9, 249 (1990).CrossRefGoogle Scholar
14Lurie, P. G. and Wilson, J. M., Surf. Sci. 65, 476 (1977).CrossRefGoogle Scholar
15Nadler, M. P., Donovan, T. M., and Green, A. K., Thin Solid Films 116, 241 (1984), and references therein.CrossRefGoogle Scholar
16Gonzalez-Hernandez, J., Chao, B. S., and Pawlik, D. A., J. Vac. Sci. Technol. A 7, 2332 (1989).CrossRefGoogle Scholar
17Joshi, A., Nimmagadda, R., and Herrington, J., J. Vac. Sci. Technol. A 8, 2137 (1990).CrossRefGoogle Scholar