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Twin wall distortions through structural investigation of epitaxial BiFeO3 thin films

Published online by Cambridge University Press:  04 November 2011

Chad M. Folkman ,
Seung-Hyub Baek  and
Chang-Beom Eom
Chad M. Folkman
Affiliation:
Department of Material Science and Engineering, University of Wisconsin–Madison, Madison, Wisconsin 53706
Seung-Hyub Baek
Affiliation:
Department of Material Science and Engineering, University of Wisconsin–Madison, Madison, Wisconsin 53706
Chang-Beom Eom*
Affiliation:
Department of Material Science and Engineering, University of Wisconsin–Madison, Madison, Wisconsin 53706
*
a)Address all correspondence to this author. e-mail: eom@engr.wisc.edu
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Abstract

In this work, epitaxial (001) BiFeO3 thin films were deposited on SrTiO3 and TbScO3 single-crystal substrates and analyzed with high-resolution x-ray diffraction—reciprocal space mapping. A basic method was developed to extract structural details of the as-grown BiFeO3 film, including (i) epitaxial strain, (ii) ferroelastic domains, and (iii) lattice rotations. After demonstrating the method, extrinsic distortions at vertical twin walls were determined for specific BiFeO3 heterostructures. A relatively large distortion (0.20° ± 0.08°) was measured in a multidomain (12) and incoherent film, while a nearly intrinsic distortion (0.04° ± 0.03°) was measured in a two-domain coherent film. This work offers insights into the structure of multiferroic BiFeO3 thin films with a general approach that is appropriate for low symmetry epitaxial heterostructures.

Keywords

Crystallographic structureEpitaxyFerroelectric
Type
Articles
Information
Journal of Materials Research , Volume 26 , Issue 22 , 28 November 2011 , pp. 2844 - 2853
Copyright
Copyright © Materials Research Society 2011

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