Hostname: page-component-848d4c4894-p2v8j Total loading time: 0.001 Render date: 2024-05-25T15:11:41.894Z Has data issue: false hasContentIssue false

Uniaxial Compressive Stress Dependence of the High-Field Dielectric and Piezoelectric Performance of Soft PZT Piezoceramics

Published online by Cambridge University Press:  03 March 2011

Dayu Zhou*
Affiliation:
Forschungszentrum Karlsruhe, Institut fuer Materialforschung II, D-76021 Karlsruhe, Germany
Marc Kamlah
Affiliation:
Forschungszentrum Karlsruhe, Institut fuer Materialforschung II, D-76021 Karlsruhe, Germany
Dietrich Munz
Affiliation:
Forschungszentrum Karlsruhe, Institut fuer Materialforschung II, D-76021 Karlsruhe, Germany
*
a) Address all correspondence to this author.e-mail: dayu.zhou@imf.fzk.de
Get access

Abstract

The influence of uniaxial prestress on dielectric and piezoelectric performance was studied for soft lead zirconate titanate piezoceramics. High electric field induced polarization and longitudinal/transverse strain were measured at different compression preload levels of up to −400 MPa. The parameters evaluated included polarization/strain outputs, dielectric permittivity, piezoelectric constants, and dissipation energy as a function of the mechanical preload and electric-field strength. The results indicate a significant enhancement of the dielectric and piezoelectric performance within a certain prestress loading range. At much higher stress levels, the predominant mechanical depolarization effect makes the material exhibit hardly any piezoeffect. However, the enhanced performance achieved by a small stress preload is accompanied by an unfavorable increased hysteresis, and consequently, increased energy loss, which is attributed to a larger extrinsic contribution due to more non-180° domain switching induced by the combined electromechanical load.

Type
Articles
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Akhras, G., Canadian Military Journal, Autumn 25 (2000).Google Scholar
2Trease, B.P., M.S.Thesis University of Michigan (2002).Google Scholar
3Jaffe, B., Cook, W.R. and Jaffe, H.Piezoelectric Ceramics (Academic Press, New York, 1971).Google Scholar
4Haertling, G.H., J. Am. Ceram. Soc. 82, 797 (1999).CrossRefGoogle Scholar
5Uchino, K.Ferroelectric Devices (Marcel Dekker, New York, 2000).Google Scholar
6Setter, N. and Waser, R., Acta Mater. 48, 151 (2000).CrossRefGoogle Scholar
7 IEEE Standard on Piezoelectricity, ANSI/IEEE Std. 176-1987 (IEEE, New York, 1988).Google Scholar
8Schuh, C., Steinkopff, Th., Wolff, A. and Lubitz, K. in Smart Structures and Materials 2000: Active Materials: Behavior and Mechanics, edited by Lynch, C.S., Proceedings of The Society of Photo-Optical Instrumentation Engineers, Newport Beach, CA, 3992 (2000) p. 165.Google Scholar
9Giurgiutiu, V. and Pomirleanu, R. in Smart Structures and Materials 2001: Smart Structures and Integrated Systems, edited by Davis, L.P., Proceedings of The Society of Photo-Optical Instrumentation Engineers, Newport Beach, CA, 4327 (2001) p. 610.CrossRefGoogle Scholar
10Mitrovic, M., Carman, G.P. and Straub, F.K., Int. J. Solids Struct. 38, 4357 (2001).CrossRefGoogle Scholar
11Fett, T., Müller, S., Munz, D. and Thun, G., J. Mater. Sci. Lett. 17, 261 (1998).CrossRefGoogle Scholar
12Viehland, D., Tito, F., McLaughlin, E., Robinson, H., Janus, R., Ewart, L. and Powers, J., J. Appl. Phys. 90, 1496 (2001).CrossRefGoogle Scholar
13Straub, F.K. and Merkley, D.J. in Smart Structures and Materials 1995: Smart Structures and Integrated Systems edited by Chopra, I., Proceedings of The Society of Photo-Optical Instrumentation Engineers, San Diego, CA, 2443 (1995) p. 89.CrossRefGoogle Scholar
14Lynch, C.S., Acta Mater. 44, 4137 (1996).CrossRefGoogle Scholar
15Mukherjee, B.K., Ren, W., Liu, S-F., Masys, A.J. and Yang, G. in Smart Structures and Materials 2001: Active Materials: Behavior and Mechanics, edited by Lynch, C.S., Proceedings of The Society of Photo-Optical Instrumentation Engineers, Newport Beach, CA, 4333 (2001) p. 41.Google Scholar
16Chaplya, P.M. and Carman, G.P., J. Appl. Phys. 90, 5278 (2001).CrossRefGoogle Scholar
17Nuffer, J., Lupascu, D.C. and Rödel, J., Acta Mater. 48, 3783 (2000).CrossRefGoogle Scholar
18Zhou, D., Ph.D. Thesis, University Karlsruhe (2003).Google Scholar
19Munz, D. and Fett, T.Ceramics-Mechanical Properties, Failure Behaviour, Materials Selection, Springer Series in Materials Science, 36, (Springer-Verlag, Berlin, Germany, 1999).CrossRefGoogle Scholar
20Yang, G., Liu, S-F., Ren, W. and Mukherjee, B.K. in Smart Structure and Materials 2000: Active Materials: Behaviour and Mechanics, edited by Lynch, C.S., Proceedings of The Society of Photo-Optical Instrumentation Engineers, Newport Beach, CA, 3992, (2000) p. 103.Google Scholar
21Zhang, Q.M., Pan, W.Y., Jang, S.J. and Cross, L.E., J. Appl. Phys. 64, 6445 (1988).CrossRefGoogle Scholar
22Zhang, Q.M., Wang, H., Kim, N. and Cross, L.E., J. Appl. Phys. 75, 454 (1994).CrossRefGoogle Scholar
23Arlt, G., Dederichs, H. and Herbiet, R., Ferroelectrics 74, 37 (1987).CrossRefGoogle Scholar
24Dausch, D.E., J. Am. Ceram. Soc. 80, 2355 (1997).CrossRefGoogle Scholar
25Sakai, T., Terai, Y. and Ishikiriyama, M., Jpn. J. Appl. Phys. 34, 5276 (1995).CrossRefGoogle Scholar
26Wang, D., Fotinich, Y. and Carman, G.P., J. Appl. Phys. 83, 5342 (1998).CrossRefGoogle Scholar