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Prospects for 3D Characterization of Materials by Aberration Corrected STEM and SCEM

Published online by Cambridge University Press:  05 August 2007

PD Nellist ,
EC Cosgriff ,
G Behan  and
AI Kirkland
PD Nellist
Affiliation:
Univeristy of Oxford,UK
EC Cosgriff
Affiliation:
Univeristy of Oxford,UK
G Behan
Affiliation:
Univeristy of Oxford,UK
AI Kirkland
Affiliation:
Univeristy of Oxford,UK
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 130 - 131
Copyright
© 2007 Microscopy Society of America

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