Skip to main content Accessibility help
×
Home
Hostname: page-component-564cf476b6-s5ssh Total loading time: 0.15 Render date: 2021-06-22T00:03:01.360Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.

Published online by Cambridge University Press:  01 August 2018

Mark P. Oxley
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Axiel Yael Birenbaum
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Tribhuwan Pandey
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Valentino R. Cooper
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Miaofang Chi
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge TN, USA.
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this article. For PDF version, please use the ‘Save PDF’ preceeding this image.
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Yang, H., et al Nature. Communications 7 2016) p 12532.Google ScholarPubMed
[2] Shibata, N., et al Nature. Communications 8 2017 15631.Google Scholar
[3] Allen, L.J., D’Alfonso, A.J. Findlay, S.D. Ultramicroscopy 151 2015) p 11.CrossRefGoogle Scholar
[4] Borghardt, S., et al, Physical Review Letters 118 2017 086101.CrossRefGoogle Scholar
[5] Wang, W.L. Kaxiras, E Physical Revie B 87 2013 085103.CrossRefGoogle Scholar
[6] Meyer, L.C., et al, Nature Materials 10 2011) p 209.CrossRefGoogle Scholar
[7] This research was supported by the US Department of Energy, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, and ORNL’s Center for Nanophase Materials Sciences, which is a U.S. DOE Office of Science User Facility.Google Scholar
You have Access
1
Cited by

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *