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Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem

  • Rene Sachsé (a1), Andreas Hertwig (a2), Ralph Kraehnert (a1) and Vasile-Dan Hodoroaba (a2)
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Abstract
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References
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[1] Ortel, E, et al, Chem Mater 23 2011) p. 3201.
[2] Ortel, E, et al, Anal Chem 88 2016) ) (p. 7083.
[3] Stratagem version 2.6, SAMx, 4, rue Galilée, 78280 Guyancourt, France.
[4] Rosu, D-M, et al, Appl Surf Sci 421 2017) p. 487.
[5] Hodoroaba, V-D, et al, Surf Interface Anal 44 2012) p. 1459.
[6] This work was funded through the European Metrology Programme for Innovation and Research (EMPIR) Project 16ENG03 Hybrid metrology for thin films in energy applications (HyMET).
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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